For transmission electron microscopy (TEM) a Tecnai F30-G2 with Super-Twin lens is available, which combines a rather high resolving power (point resolution: 0.2 nm), large tilt angles (for crystallography applications) as well as analytical options (EELS, EFTEM, HAADF-STEM, EDXS). The investigation of air-sensitive substances is made possible. Current research projects comprise the real-structure characterisation and nano-analysis of germanium and silicon clathrates, the formation of super-structure in Delafossites as Cu3Ni2SbO6 and order-disorder phenomena in boron carbide B13C2.

Additionally, a transmission electron microscope Tecnai 10 is available with high-contrast lens and an attachment for precession electron diffraction (PED). The intensities of reflections taken from PED, which are kinematical in a good approximation, allow a structure refinement in analogy to x-ray structure refinement. The unbeatable advantage of electron crystallography lies in its applicability to the smallest specimen volumes, e.g. complex inter-metallic phases in heterogeneous textures.

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