Erica Warth - Investigation of deep trap profiles in sulfur hyperdoped silicon based on a graded p-n junction model

  • Date: Oct 8, 2021
  • Time: 11:00 AM - 01:00 PM (Local Time Germany)
  • Location: online
  • Room: Zoom, login to be requested at office.felser@cpfs.mpg.de
Erica Warth - Investigation of deep trap profiles in sulfur hyperdoped silicon based on a graded p-n junction model
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