Maria Isabel Alonso (Institut de Ciència de Materials de Barcelona) - Ellipsometry studies of photovoltaic materials

Abstract:

The dielectric function of a material contains all the information on its fundamental electronic excitation spectrum. Depending on the origin of the relevant excitation, a characteristic energy range will be significant. For semiconductors, the main interband electronic transitions typically take place in the optical range, from the near-infrared to the visible and near ultraviolet regions. The range of these characteristic energies is about 1 to 6 eV, which can be measured using commercial spectroscopic ellipsometers.

This talk will introduce ellipsometry and show its application using various examples of materials relevant to photovoltaics, such as hybrid lead halide perovskites. Ellipsometric spectra can be associated with both structural and optical parameters of the sample. In particular, the connection between the spectral characteristics and the band structures will be illustrated through data analysis models pertinent to their practical description.

https://eu02web.zoom-x.de/j/67910291283?pwd=TzNDaHViY2dBYjNpSUhwUzZDcHEvZz09

Meeting-ID: 679 1029 1283

Access Code: 01187