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Journal Article (7)

  1. 2011
    Journal Article
    Pacheco, V.; Cardoso-Gil, R.; Tepech-Carrillo, L.; Grin, Y.: Corrosion behavior of thermoelectric clathrates α- and β-Eu8Ga16−xGe30+x in air. Corrosion Science 53 (7), pp. 2368 - 2373 (2011)
  2. 2005
    Journal Article
    Bentien, A.; Pacheco, V.; Paschen, S.; Grin, Y.; Steglich, F.: Transport properties of composition tuned α- and β-Eu8Ga16-xGe30+x. Physical Review B 71, pp. 165206-1 - 165206-12 (2005)
  3. Journal Article
    Pacheco, V.; Bentien, A.; Carrillo-Cabrera, W.; Paschen, S.; Steglich, F.; Grin, Y.: Relationship between composition and charge carrier concentration in Eu8Ga16-xGe30+x clathrates. Physical Review B 71, pp. 165205-1 - 165205-10 (2005)
  4. Journal Article
    Sichelschmidt, J.; Voevodin, V.; Pacheco, V.; Grin, Y.; Steglich, F.; Nishi, T.; Kimura, S.: Optical investigations of the clathrate α-Eu8Ga16Ge30. The European Physical Journal B, Condensend Matter Physics 46 (3), pp. 363 - 366 (2005)
  5. 2004
    Journal Article
    Yuan, H. Q.; Grosche, F. M.; Carrillo-Cabrera, W.; Pacheco, V.; Sparn, G.; Baenitz, M.; Schwarz, U.; Grin, Y.; Steglich, F.: Interplay of superconductivity and structural phase transition in the clathrate Ba6Ge25. Physical Review B 70 (17), pp. 174512-1 - 174512-6 (2004)
  6. 2003
    Journal Article
    Paschen, S.; Pacheco, V.; Bentien, A.; Sanchez, A.; Carrillo-Cabrera, W.; Baenitz, M.; Iversen, B. B.; Grin, Y.; Steglich, F.: Are type-I clathrates Zintl phases and 'phonon glasses and electron single crystals'? Physica B-Condensed Matter 328 (1-2), pp. 39 - 43 (2003)
  7. 2001
    Journal Article
    Pacheco, V.; Carrillo-Cabrera, W.; Tran, V. H.; Paschen, S.; Grin, Y.: Comment on "Silicon Clathrate with an f-Electron system". Physical Review Letters 87 (9), 099601, p. 099601-1 - 099601-1 (2001)

Conference Paper (1)

  1. 2003
    Conference Paper
    Bentien, A.; Paschen, S.; Pacheco, V.; Grin, Y.; Steglich, F.: High-temperature thermoelectric properties of α- and β-Eu8Ga16Ge30. In: Proceedings of the 22nd International Conference on Thermoelectrics, pp. 131 - 133. IEEE (2003)
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