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Efimenko, A. K.; Hollmann, N.; Hoefer, K.; Weinen, J.; Takegami, D.; Wolff, K. K.; Altendorf, S. G.; Hu, Z.; Rata, A. D.; Komarek, A. C. et al.; Nugroho, A. A.; Liao, Y. F.; Tsuei, K.-D.; Hsieh, H. H.; Lin, H.-J.; Chen, C. T.; Tjeng, L. H.; Kasinathan, D.: Electronic signature of the vacancy ordering in NbO (Nb₃O₃). Physical Review B 96 (19), 195112, pp. 1 - 7 (2017)

Hoefer, K.; Becker, C.; Wirth, S.; Tjeng, L. H.: Protective capping of topological surface states of intrinsically insulating Bi₂Te₃. AIP Advances 5 (9), 097139, pp. 1 - 6 (2015)

Höfer, K.; Becker, C.; Rata, A. D.; Swanson, J.; Thalmeier, P.; Tjeng, L. H.: Den elektrischen Eigenschaften topologischer Isolatoren auf der Spur. Jahrbuch - Max-Planck-Gesellschaft (2015)

Hoefer, K.; Becker, C.; Rata, D.; Swanson, J.; Thalmeier, P.; Tjeng, L. H.: Intrinsic conduction through topological surface states of insulating Bi₂Te₃ epitaxial thin films. Proceedings of the National Academy of Sciences of the United States of America 111 (42 ), pp. 14979 - 14984 (2014)

Höfer, K.: All in situ ultra-high vacuum study of Bi₂Te₃ topological insulator thin films. Dissertation, XIV, 118, VI pp., Technische Universität, Dresden (2017)