Journal Article (1)

Journal Article
Kozina, X.; Jaeger, T.; Ouardi, S.; Gloskowskij, A.; Stryganyuk, G.; Jakob, G.; Sugiyama, T.; Ikenaga, E.; Fecher, G. H.; Felser, C.: Electronic structure and symmetry of valence states of epitaxial NiTiSn and NiZr0.5Hf0.5Sn thin films by hard x-ray photoelectron spectroscopy. Applied Physics Letters 99 (22), 221908, pp. 221908-1 - 221908-3 (2011)
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