Startseite Newsroom Vorlesungen, Workshops, Konferenzen Archiv Vorträge Erica Warth - Investigation of deep trap profiles in sulfur hyperdoped silicon based on a graded p-n junction model Erica Warth - Investigation of deep trap profiles in sulfur hyperdoped silicon based on a graded p-n junction model Datum: 08.10.2021 Uhrzeit: 11:00 - 13:00 Ort: online Raum: Zoom, login to be requested at office.felser@cpfs.mpg.de
